现代制造工程 ›› 2025, Vol. 535 ›› Issue (4): 132-139.doi: 10.16731/j.cnki.1671-3133.2025.04.016

• 仪器仪表/检测/监控 • 上一篇    下一篇

基于光栅测长技术的光学投影式测长机升级改造*

李昆1,2, 崔派1, 江毅2, 吴银3, 瞿剑苏1, 刘佳1, 刘婷婷1   

  1. 1 中国航空工业集团计量所,北京 100095;
    2 北京理工大学光电学院,北京 100081;
    3 河南中原特钢装备制造有限公司,济源 459008
  • 收稿日期:2024-08-20 出版日期:2025-04-18 发布日期:2025-05-08
  • 作者简介:李昆,硕士,高级工程师,主要研究方向为几何量计量技术研究与仪器开发。E-mail:likun2503@126.com
  • 基金资助:
    * 工信部民用飞机专项科研项目(MJZ3-4N22);国家重点研发计划项目(2023YFB3407900)

Upgrading and transformation of optical projection-type length measuring machines based on grating length measurement technology

LI Kun1,2, CUI Pai1, JIANG Yi2, WU Yin3, QU Jiansu1, LIU Jia1, LIU Tingting1   

  1. 1 ChangCheng Institute of Metrology & Measurement,Beijing 100095,China;
    2 School of Optical and Photonics,Beijing Institute of Technology,Beijing 100081,China;
    3 Henan Zhongyuan Special Steel Equipment Manufacturing Co.,Ltd.,Jiyuan 459008,China
  • Received:2024-08-20 Online:2025-04-18 Published:2025-05-08

摘要: 针对常见的光学投影式测长机在使用过程中因读数难、难读准以及光学系统老化等造成精度下降的问题,提出了一种将传统人眼瞄刻线的光学系统升级改造为光栅数显系统的测长机技术方案。基于光栅测长技术,设计加装大理石导轨和光栅测量系统,实现长度量高精度数字化测量。通过选用高精度光栅式测微传感器,保证测头高精度对零和测量过程中被测件触力大小一致性。开发了基于可编程逻辑器件(Complex Programmable Logic Device,CPLD)的专用光栅数显表,实现对光栅测量系统和测微传感器信号的高速实时处理。编写了误差修正补偿算法模块、数据处理显示模块、数据库管理模块以及辅助功能控制模块等,形成了测长机上位机测量专用软件。试验结果表明,经升级改造后的测长机,其分辨力可达0.1 μm,在2 m测长范围内,示值误差为±(0.5+L/300) μm,与原有光学投影式测长机相比,精度指标进一步提高,并且读数简单、示值稳定性好,满足计量器具的计量检定要求。综上所述,该方法具有较高的应用与推广价值。

关键词: 计量仪器, 测长机, 光栅数显, 升级改造

Abstract: To address challenges commonly encountered with optical projection-type length measuring machines during use,such as difficulty in reading, inaccurate readings, and accuracy degradation caused by optical system aging, a technical solution for upgrading the traditional human eye-based engraved line optical system to a grating-based digital display system was proposed. Based on grating length measurement technology,the solution included the design and installation of a marble guide and a grating measurement system to achieve high-precision digital length measurement. High-precision grating micrometer sensors were employed to ensure accurate probe zeroing and consistency in the contact force applied to the measured components during the measurement process. A specialized grating digital display unit,developed using Complex Programmable Logic Device (CPLD) technology,enabled high-speed real-time processing of signals from the grating scale and micrometer sensors.Additionally,software for the upper computer of the length measuring machine was developed,incorporating modules for error correction and compensation algorithms,data processing and display,database management,and auxiliary function control. Experimental results demonstrate that the upgraded length measuring machine achieves a resolution of 0.1 μm. Within a 2 m measurement range,the display error is ±(0.5+L/300) μm. Compared to the original optical projection-type length measuring machine,the upgraded system offers significantly improved accuracy,simplified readings,and enhanced stability of the display values. The system meets the requirements for metrological verification of measuring instruments.In conclusion,this method has high application value and strong potential for widespread adoption.

Key words: measuring instruments, length measuring machine, raster digital display, upgrade and renovation

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