现代制造工程 ›› 2025, Vol. 542 ›› Issue (11): 100-107.doi: 10.16731/j.cnki.1671-3133.2025.11.014

• 仪器仪表/检测/监控 • 上一篇    下一篇

多光照荧光磁粉联合成像检测方法*

樊俊伟1, 陈彦廷1, 徐启振1, 刘伶书1, 黄世一2, 康宜华1, 曹育杰3   

  1. 1 华中科技大学机械科学与工程学院,武汉 430074;
    2 青岛农业大学机电工程学院,青岛 266109;
    3 华中科技大学无锡研究院,无锡 214100
  • 收稿日期:2025-01-20 出版日期:2025-11-18 发布日期:2025-11-27
  • 作者简介:樊俊伟,硕士研究生,主要研究方向为无损检测与磁粉检测。康宜华,教授,博士生导师,主要研究方向为漏磁、超声、电磁超声等无损检测新技术研究和数字化与自动化无损检测装备开发工作。E-mail:yihuakang@hust.edu.cn
  • 基金资助:
    *湖北省科技计划项目(2024BAB065)

Multi-illumination fluorescent magnetic particle joint imaging detection method

FAN Junwei1, CHEN Yanting1, XU Qizhen1, LIU Lingshu1, HUANG Shiyi2, KANG Yihua1, CAO Yujie3   

  1. 1 School of Mechanical Science & Engineering of Huazhong University of Science and Technology, Wuhan 430074, China;
    2 College of Mechanical and Electrical Engineering of Qingdao Agricultural University, Qingdao 266109, China;3 HUST-WUXI Research Institute, Wuxi 214100, China
  • Received:2025-01-20 Online:2025-11-18 Published:2025-11-27

摘要: 荧光磁粉探伤广泛应用于铁磁性零件表面无损检测,在实现机器自动化检测过程中,反光区域和背景噪声往往会影响裂纹的识别精度。提出了一种荧光磁粉在多光照下联合成像方法,通过对比不同光源(红光与紫外光)照射下荧光磁粉成像的不同特性,对两类图像进行差分及阈值掩模处理,有效减少了反光和背景噪声的影响,可突出显示裂纹特征,提升检测的准确性、减少误报率。通过搭建实验平台,进行图像采集及缺陷分割,结果显示所提方法能够在背景噪声干扰和反光遮挡的条件下准确分割裂纹。

关键词: 机器视觉, 荧光磁粉, 裂纹分割, 图像差分

Abstract: Fluorescent magnetic particle flaw detection is widely used in non-destructive surface testing of ferromagnetic parts,and in the process of realizing automated machine inspection,the reflective area and background noise often affect the recognition accuracy of cracks. A joint imaging method of fluorescent magnetic powder under multiple light sources is proposed, by comparing the different characteristics of fluorescent magnetic powder imaging under the irradiation of different light sources (red light and ultraviolet light),and by performing the difference and threshold mask processing on the two types of images,the effects of reflections and background noise are effectively reduced,and the crack characteristics are highlighted to improve the accuracy of detection and reduce the rate of false alarms. By building an experimental platform for image acquisition and defect segmentation,the results show that the proposed method is able to accurately segment cracks under the conditions of background noise interference and reflection masking.

Key words: machine vision, fluorescent magnetic particle, crack segmentation, image difference

中图分类号: 

版权所有 © 《现代制造工程》编辑部 
地址:北京市东城区东四块玉南街28号 邮编:100061 电话:010-67126028 电子信箱:2645173083@qq.com
本系统由北京玛格泰克科技发展有限公司设计开发 技术支持:support@magtech.com.cn